R. Fabian Pease
Pease's group researches the engineering of ultra-fine structures, circuits, and devices using electron beam and other nanofabrication technology.
Last modified Wed, 25 Jul, 2012 at 11:02
| Title | Author(s) | Journal | Date |
|---|---|---|---|
| Self inspection of integrated circuits pattern defects using support vector machines | Pease, RF, et. al. | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | 11-2005 |
| Narrow cone emission from negative electron affinity photocathodes | Pease, RF, et. al. | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | 11-2005 |
| Reconstruction of pattern images from scanning electron microscope images | Pease, RF, et. al. | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | 11-2005 |
National Academy of Engineering
