Title:
Analytical TEM Examinations of CoPt-TiO2 Perpendicular Magnetic Recording Media
Author(s):
J. Risner; J. Bentley; R. Sinclair
Journal:
Microscopy and Microanalysis
, Volume 13
, Number 2
Date Published:
2007-4
Title:
Orientation Relationship in Diamond and Silicon Carbide Composites
Author(s):
J.S. Park; R. Sinclair; D. Rowcliffe; M. Stern; H. Davidson
Journal:
Diamond and Related Materials
, Volume 16
, Number 3
Date Published:
2007-3
Title:
FIB and TEM Studies of Interface Structure in Diamond-SiC Composites
Author(s):
J.S. Park; R. Sinclair; D. Rowcliffe; M. Stern; H. Davidson
Journal:
Journal of Materials Science
, Volume 41
, Number 14
Date Published:
2006
Title:
Observation of the Effect of Grain Orientation on Chromium Segregation in Longitudinal Magnetic Media
Author(s):
J.D. Risner; R. Sinclair; J. Bentley
Journal:
Journal of Applied Physics
, Volume 99
Date Published:
2006
Book Title:
Midsize Facilities: the Infrastructure for Materials Research Book Authors/Eds.:
Committee on Smaller Facilities; R. Sinclair (chair); A. Aprahamian; A. I. Bienenstock; J. P. Bradley; D. R. Clarke; J. W. Davenport; F. J. DiSalvo; C. A. Evans, Jr.; W. P. Lowe; F. M. Ross; D. J. Smi
Publisher:
National Academies Press
Date Published:
2006
Details:
National Research Council of the National Academy of Sciences
Title:
FIB and TEM Studies of Interface Structure in Diamond-SiC Composites Author(s):
J.S. Park; R. Sinclair; D. Rowcliffe; M. Stern; H. Davidson
Conference:
International Congress on Electron Microscopy XVI
Date Published:
2006
Title:
TEM Studies of Reactions in Thin Films and their Interfaces Author(s):
R Sinclair
Conference:
International Congress on Electron Microscopy XVI
Date Published:
2006
Title:
Information Storage Technology: The Role of the TEM Author(s):
R. Sinclair; J. Risner; U. Kwon
Conference:
Microscopy and Microanalysis
Date Published:
2006
Title:
Characterization of AuFe-C Core-shell Nanoparticles Author(s):
H. Li; H. Dai; L. Xing; R. Sinclair
Conference:
Microscopy and Microanalysis
Date Published:
2006
Title:
Effect of Magnetic Recording Layer Thickness on Media Performance in CoCrPt-Oxide Perpendicular Media
Author(s):
U. Kwon; H.S. Jung; M. Kuo; E.M.T. Velu; S.S. Malhotra; W. Jiang; G. Bertero; R. Sinclair
Journal:
IEEE Trans Magn
, Volume 42
, Number 10
Date Published:
2006
Title:
Crystallization and anisotropic dielectric properties of tantalum oxide thin films
Author(s):
Sinclair, R; Min, KH.
Journal:
JOURNAL OF CERAMIC PROCESSING RESEARCH
Date Published:
2005
Title:
Synthesis and Characterization of Fe-C Core-shell Nanoparticles Author(s):
H. Li; H. Dai; R. Sinclair
Conference:
Microscopy and Microanalysis
Date Published:
2005
Title:
HRTEM and Nano-probe EDS Studies on the Microstructure of CoCrPtO Perpendicular Recording Media with Ru/Ru-oxide Interlayers Author(s):
U. Kwon; R. Sinclair
Conference:
Microscopy and Microanalysis
Date Published:
2005
Title:
High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media Author(s):
J.D. Risner; T.P. Nolan; J. Bentley; S.Z. Wu; S.D. Harkness; R. Sinclair
Conference:
Microscopy and Microanalysis
Date Published:
2005
Title:
High Resolution and Analytical TEM of Cr Grain Boundary Segregation in Co-alloy Longitudinal Hard Disk Magnetic Recording Media Author(s):
J. Risner; R. Sinclair; J. Bentley
Conference:
Microscopy and Microanalysis
Date Published:
2005
Title:
Ru/Ru-oxide Interlayers for CoCrPtO Perpendicular Recording Media
Author(s):
U. Kwon; R. Sinclair; E.M.T. Velu; S. Malhotra; G. Bertero
Journal:
IEEE Trans Magn
, Volume 41
, Number 10
Date Published:
2005
Title:
Crystallization Behavior of ALD-Ta2O5 Thin Films: An Application of In-situ TEM
Author(s):
K.-H. Min; R. Sinclair; L.-S. Park; S.-T. Kim; U.-I. Chung
Journal:
Philosophical Magazine
, Volume 85
, Number 18
Date Published:
2005
Title:
Application of In Situ HREM to Study Crystallization in Materials
Author(s):
R. Sinclair, K.-H. Min, U. Kwon
Journal:
Materials Science Forum
, Volume 494
Date Published:
2005
Chapter Title:
Thermochemical Properties and Phase Diagrams
Chapter Author(s):
R. Sinclair; R. Madar; M. Setton
Book Title:
Properties of Metal Silicides Book Authors/Eds.:
K. Maex; M. Van Rossum
Publisher:
Institute of Electrical Engineers, London
Date Published:
1995
Chapter Title:
Electron Microscope
Chapter Author(s):
R. Sinclair
Book Title:
1987 Yearbook of Science and Technology Book Authors/Eds.:
S.P. Parker (ed.)
Publisher:
McGraw-Hill
Date Published:
1986
Chapter Title:
High Resolution Electron Microscopy
Chapter Author(s):
R. Sinclair
Book Title:
Quantitative Electron Microscopy Book Authors/Eds.:
J.N. Chapman; A.J. Craven
Publisher:
SUSSP Publications, Edinburgh
Date Published:
1984
Chapter Title:
Recent Developments in Lattice Imaging of Materials
Chapter Author(s):
R. Sinclair
Book Title:
Annual Reviews of Materials Science Book Authors/Eds.:
R.A. Huggins
Publisher:
Annual Reviews, Inc.
Date Published:
1981
Chapter Title:
Microanalysis by Lattice Imaging
Chapter Author(s):
R. Sinclair
Book Title:
Analytical Electron Microscopy Book Authors/Eds.:
J.J. Hren; J. I. Goldstein; D.C. Joy
Publisher:
Plenum Press
Date Published:
1979
Chapter Title:
Direct Observation and Characterization of Lattice Defects in Materials
Chapter Author(s):
R. Sinclair
Book Title:
Treatise on Materials Science and Technology Book Authors/Eds.:
R.K. McCrone
Publisher:
Academic Press
Date Published:
1977
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